CMM Probes MPP-310Q Ultra-High accuracy and low measuring force Scanning Probe This ultra-high precision scanning probe incorporates built-in XYZ scales for highest accuracy performance. The compact size of this probe is ideal for low measuring force and high speed scanning. Data collection can be performed by scanning measurement, ultrahigh precision point measurement and center alignment measurement. Special developed for our Ultra-High accuracy CMM • High resolution of 0,01 μm • Measuring range ±1 mm • Extremely low measuring forces of 0,03 N • Styli length up to 200 mm • Air bearing for smooth measurements • Axis clamping for scanning on slanted or arched surfaces MPP-310Q PH20 Rapid tactile measurements at any probe angle • Head touch for improved repeatability • Feature-based calibration for improved accuracy • Automatic stylus change with TP20 modules and optional TCR20 change rack • Allowing subsequent measurement at any head angle • Full support in MCOSMOS and MiCAT Planner • 5-axis control on CMM’s with UC400 / 480 controller and PHC20 interface Infinite B-axis rotation All products to be sold to commercial customers. Product illustrations are without obligation. Product descriptions, 554 All products to be sold to commercial customers. Product illustrations are without obligation. Product descriptions, in particular any and all technical specifications, are only binding when explicitly agreed upon.
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